Single-image Reflectance and Transmittance Estimation from Any Flatbed Scanner
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Abstract (arXiv)
Flatbed scanners have emerged as promising devices for high-resolution, single-image material capture. However, existing approaches assume very specific conditions, such as uniform diffuse illumination, which are only available in certain high-end devices, hindering their scalability and cost. In contrast, in this work, we introduce a method inspired by intrinsic image decomposition, which accurately removes both shading and specularity, effectively allowing captures with any flatbed scanner. Further, we extend previous work on single-image material reflectance capture with the estimation of opacity and transmittance, critical components of full material appearance (SVBSDF), improving the results for any material captured with a flatbed scanner, at a very high resolution and accuracy
Key facts. Cited by 1 paper in the map (data through 14 Oct 2026). Builds on 34 of its 70 references that are in the map. First posted on arXiv 20 Feb 2025.
Builds on
34 of 70 references.
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22 more
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Citing papers per year: 2025: 1.
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