Location is Key: Leveraging Large Language Model for Functional Bug Localization in Verilog
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Abstract (arXiv)
Bug localization in Verilog code is a crucial and time-consuming task during the verification of hardware design. Since introduction, Large Language Models (LLMs) have showed their strong programming capabilities. However, no work has yet considered using LLMs for bug localization in Verilog code. This paper presents Location-is-Key, an opensource LLM solution to locate functional errors in Verilog snippets. LiK achieves high localization accuracy, with a pass@1 localization accuracy of 93.3% on our test dataset based on RTLLM, surpassing GPT-4's 77.9% and comparable to Claude-3.5's 90.8%. Additionally, the bug location obtained by LiK significantly improves GPT-3.5's bug repair efficiency (Functional pass@1 increased from 40.39% to 58.92%), highlighting the importance of bug localization in LLM-based Verilog debugging. Compared to existing methods, LiK only requires the design specification and the erroneous code snippet, without the need for testbenches, assertions, or any other EDA tools. This research demonstrates the feasibility of using LLMs for Verilog error localization, thus providing a new direction for automatic Verilog code debugging.
Key facts. Cited by 8 papers in the map (data through 7 Oct 2026). Builds on 19 of its 36 references that are in the map. First posted on arXiv 23 Sep 2024.
Builds on
19 of 36 references.
References · 19
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7 more
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Citing papers per year: 2025: 5; 2026: 3.
8 papers.
- 2025From Concept to Practice: an Automated LLM-aided UVM Machine for RTL Verificationcited by 8
- 2025iDSE: Navigating Design Space Exploration in High-Level Synthesis Using LLMscited by 6
- 2026ChatSVA: Bridging SVA Generation for Hardware Verification via Task-Specific LLMscited by 5
- 2025A Large Language Model-based Multi-Agent Framework for Analog Circuits' Sizing Relationships Extractioncited by 3
- 2025ChipMind: Retrieval-Augmented Reasoning for Long-Context Circuit Design Specificationscited by 3
- 2025R3A: Reliable RTL Repair Framework with Multi-Agent Fault Localization and Stochastic Tree-of-Thoughts Patch Generationcited by 1
- 2026TOPCELL: Topology Optimization of Standard Cell via LLMscited by 0
- 2026Clover: A Neural-Symbolic Agentic Harness with Stochastic Tree-of-Thoughts for Verified RTL Repaircited by 0
- 2026Clover: A Neural-Symbolic Agentic Harness with Stochastic Tree-of-Thoughts for Verified RTL Repair19 Apr 2026
- 2026TOPCELL: Topology Optimization of Standard Cell via LLMs15 Apr 2026
- 2026ChatSVA: Bridging SVA Generation for Hardware Verification via Task-Specific LLMs3 Apr 2026
- 2025ChipMind: Retrieval-Augmented Reasoning for Long-Context Circuit Design Specifications5 Dec 2025
- 2025R3A: Reliable RTL Repair Framework with Multi-Agent Fault Localization and Stochastic Tree-of-Thoughts Patch Generation25 Nov 2025
- 2025A Large Language Model-based Multi-Agent Framework for Analog Circuits' Sizing Relationships Extraction23 Jun 2025
- 2025iDSE: Navigating Design Space Exploration in High-Level Synthesis Using LLMs28 May 2025
- 2025From Concept to Practice: an Automated LLM-aided UVM Machine for RTL Verification28 Apr 2025