Bias Detection via Maximum Subgroup Discrepancy

Bias evaluation is fundamental to trustworthy AI, both in terms of checking data quality and in terms of checking the outputs of AI systems. In testing data quality, for example, one may study the distance of a given dataset, viewed as a distribution, to a given ground-truth reference dataset. However, classical metrics, such as the Total Variation and the Wasserstein distances, are known to have high sample complexities and, therefore, may fail to provide a meaningful distinction in many practical scenarios. In this paper, we propose a new notion of distance, the Maximum Subgroup Discrepancy (MSD). In this metric, two distributions are close if, roughly, discrepancies are low for all feature subgroups. While the number of subgroups may be exponential, we show that the sample complexity is linear in the number of features, thus making it feasible for practical applications. Moreover, we provide a practical algorithm for evaluating the distance based on Mixed-integer optimization (MIO). We also note that the proposed distance is easily interpretable, thus providing clearer paths to fixing the biases once they have been identified. Finally, we describe a natural general bias detection framework, termed MSDD distances, and show that MSD aligns well with this framework. We empirically evaluate MSD by comparing it with other metrics and by demonstrating the above properties of MSD on real-world datasets.