Testable Learning with Distribution Shift

We revisit the fundamental problem of learning with distribution shift, in which a learner is given labeled samples from training distribution D, unlabeled samples from test distribution D' and is asked to output a classifier with low test error. The standard approach in this setting is to bound the loss of a classifier in terms of some notion of distance between D and D'. These distances, however, seem difficult to compute and do not lead to efficient algorithms. We depart from this paradigm and define a new model called testable learning with distribution shift, where we can obtain provably efficient algorithms for certifying the performance of a classifier on a test distribution. In this model, a learner outputs a classifier with low test error whenever samples from D and D' pass an associated test; moreover, the test must accept if the marginal of D equals the marginal of D'. We give several positive results for learning well-studied concept classes such as halfspaces, intersections of halfspaces, and decision trees when the marginal of D is Gaussian or uniform on ± 1d. Prior to our work, no efficient algorithms for these basic cases were known without strong assumptions on D'. For halfspaces in the realizable case (where there exists a halfspace consistent with both D and D'), we combine a moment-matching approach with ideas from active learning to simulate an efficient oracle for estimating disagreement regions. To extend to the non-realizable setting, we apply recent work from testable (agnostic) learning. More generally, we prove that any function class with low-degree L2-sandwiching polynomial approximators can be learned in our model. We apply constructions from the pseudorandomness literature to obtain the required approximators.