mlsanityData to 14 Oct 2026

Defect Spectrum: A Granular Look of Large-Scale Defect Datasets with Rich Semantics

arXiv 2310.17316 ↗First posted 26 Oct 2023cs.CVcited by 16

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Abstract (arXiv)

Defect inspection is paramount within the closed-loop manufacturing system. However, existing datasets for defect inspection often lack precision and semantic granularity required for practical applications. In this paper, we introduce the Defect Spectrum, a comprehensive benchmark that offers precise, semantic-abundant, and large-scale annotations for a wide range of industrial defects. Building on four key industrial benchmarks, our dataset refines existing annotations and introduces rich semantic details, distinguishing multiple defect types within a single image. Furthermore, we introduce Defect-Gen, a two-stage diffusion-based generator designed to create high-quality and diverse defective images, even when working with limited datasets. The synthetic images generated by Defect-Gen significantly enhance the efficacy of defect inspection models. Overall, The Defect Spectrum dataset demonstrates its potential in defect inspection research, offering a solid platform for testing and refining advanced models.

Key facts. Cited by 16 papers in the map (data through 14 Oct 2026). Builds on 34 of its 57 references that are in the map. First posted on arXiv 26 Oct 2023.

Builds on

34 of 57 references.

References · 34

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22 more
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Citing papers per year: 2023: 1; 2024: 4; 2025: 8; 2026: 3.

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