mlsanityData to 7 Oct 2026

A kernel Stein test of goodness of fit for sequential models

arXiv 2210.10741 ↗First posted 19 Oct 2022stat.ML cs.LG stat.COcited by 9

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Abstract (arXiv)

We propose a goodness-of-fit measure for probability densities modeling observations with varying dimensionality, such as text documents of differing lengths or variable-length sequences. The proposed measure is an instance of the kernel Stein discrepancy (KSD), which has been used to construct goodness-of-fit tests for unnormalized densities. The KSD is defined by its Stein operator: current operators used in testing apply to fixed-dimensional spaces. As our main contribution, we extend the KSD to the variable-dimension setting by identifying appropriate Stein operators, and propose a novel KSD goodness-of-fit test. As with the previous variants, the proposed KSD does not require the density to be normalized, allowing the evaluation of a large class of models. Our test is shown to perform well in practice on discrete sequential data benchmarks.

Key facts. Cited by 9 papers in the map (data through 7 Oct 2026). Builds on 14 of its 42 references that are in the map. First posted on arXiv 19 Oct 2022.

Builds on

14 of 42 references.

References · 14

  1. 2016A Kernelized Stein Discrepancy for Goodness-of-fit Tests and Model Evaluationcited by 236
  2. 2016A Kernel Test of Goodness of Fitcited by 143
  3. 2017Measuring Sample Quality with Kernelscited by 119
  4. 2015Measuring Sample Quality with Stein's Methodcited by 94
  5. 2016Kernels for sequentially ordered datacited by 83
  6. 2014Control functionals for Monte Carlo integrationcited by 59
  7. 2019Minimum Stein Discrepancy Estimatorscited by 57
  8. 2021Stein's Method Meets Computational Statistics: A Review of Some Recent Developmentscited by 32
  9. 2022Gradient Estimation with Discrete Stein Operatorscited by 22
  10. 2019A Kernel Stein Test for Comparing Latent Variable Modelscited by 18
  11. 2020A Stein Goodness-of-fit Test for Directional Distributionscited by 13
  12. 2020Kernelized Stein Discrepancy Tests of Goodness-of-fit for Time-to-Event Datacited by 12
2 more
  1. 2020The reproducing Stein kernel approach for post-hoc corrected samplingcited by 10
  2. 2022A Fourier representation of kernel Stein discrepancy with application to Goodness-of-Fit tests for measures on infinite dimensional Hilbert spacescited by 3

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Cited by year (2026 to 7 Oct)

Citing papers per year: 2023: 1; 2024: 4; 2025: 3; 2026: 1.

9 papers.