mlsanityData to 14 Oct 2026

A Continual Learning Framework for Adaptive Defect Classification and Inspection

arXiv 2203.08796 ↗First posted 16 Mar 2022cs.CV cs.LG stat.MLcited by 7

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Abstract (arXiv)

Machine-vision-based defect classification techniques have been widely adopted for automatic quality inspection in manufacturing processes. This article describes a general framework for classifying defects from high volume data batches with efficient inspection of unlabelled samples. The concept is to construct a detector to identify new defect types, send them to the inspection station for labelling, and dynamically update the classifier in an efficient manner that reduces both storage and computational needs imposed by data samples of previously observed batches. Both a simulation study on image classification and a case study on surface defect detection via 3D point clouds are performed to demonstrate the effectiveness of the proposed method.

Key facts. Cited by 7 papers in the map (data through 14 Oct 2026). Builds on 23 of its 42 references that are in the map. First posted on arXiv 16 Mar 2022.

Builds on

23 of 42 references.

References · 23

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11 more
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Cited by year

Citing papers per year: 2022: 1; 2023: 3; 2024: 1; 2025: 2.

7 papers.