mlsanityData to 14 Oct 2026

Overcoming Data Scarcity and Confidentiality in Hardware Assurance via Synthetic Generation

arXiv 2608.09914 ↗First posted 10 Aug 2026cs.CR cs.CVcited by 0

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Abstract (arXiv)

Hardware assurance relies on scanning electron microscopy (SEM) to verify nanoscale structures, but assembling the large, high-quality datasets required for automated analysis is impeded by time-intensive acquisition and strict intellectual property (IP) constraints on proprietary designs. We propose a privacy-preserving pipeline that secures IP by heavily distorting the functional design while generating a visually realistic synthetic dataset from a small set of initial examples. A StyleGAN first learns the distribution of hardware layout masks to generate novel, macroscopically varied structures. Subsequently, a conditional GAN (Pix2PixHD) translates these masks into realistic SEM images that preserve authentic textures and noise. The primary finding of this work is that a segmentation model trained exclusively on this synthetic data not only demonstrates a successful "sim-to-real" transfer to real images but also outperforms a baseline model trained on the limited real dataset. Because the underlying synthetic layouts are demonstrably novel and reproduce none of the specific proprietary routing of the original design, deploying the final segmentation model mitigates the risk of exposing sensitive IP to attacks like gradient inversion and membership inference, providing a highly secure, high-performance solution for hardware assurance.

Key facts. No citing papers in the map yet (data through 14 Oct 2026). Builds on 14 of its 22 references that are in the map. First posted on arXiv 10 Aug 2026.

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14 of 22 references.

References · 14

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2 more
  1. 2016Energy-based Generative Adversarial Networkcited by 119
  2. 2017Perceptual Generative Adversarial Networks for Small Object Detectioncited by 76

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  1. 2024Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Images
  2. 2026A Data-Free Membership Inference Attack on Federated Learning in Hardware Assurance
  3. 2026Bridging the Sim-to-Real Gap in Semiconductor Visual Program Synthesis via Input Binarization
  4. 2026High-Fidelity Synthetic Transmission Electron Microscopy Image Generation Using Diffusion Probabilistic Models for Data-Limited Semiconductor Metrology
  5. 2026DECIFR: Domain-Aware Exfiltration of Circuit Information from Federated Gradient Reconstruction ↗
  6. 2024ICMarks: A Robust Watermarking Framework for Integrated Circuit Physical Design IP Protection
  7. 2026Hardware Trojans from Invisible Inversions: On the Trojanizability of Standard Cell Libraries ↗
  8. 2024Parameter-Efficient Quantized Mixture-of-Experts Meets Vision-Language Instruction Tuning for Semiconductor Electron Micrograph Analysis