Design of a Graphical User Interface for Few-Shot Machine Learning Classification of Electron Microscopy Data
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Abstract (arXiv)
The recent growth in data volumes produced by modern electron microscopes requires rapid, scalable, and flexible approaches to image segmentation and analysis. Few-shot machine learning, which can richly classify images from a handful of user-provided examples, is a promising route to high-throughput analysis. However, current command-line implementations of such approaches can be slow and unintuitive to use, lacking the real-time feedback necessary to perform effective classification. Here we report on the development of a Python-based graphical user interface that enables end users to easily conduct and visualize the output of few-shot learning models. This interface is lightweight and can be hosted locally or on the web, providing the opportunity to reproducibly conduct, share, and crowd-source few-shot analyses.
Key facts. Cited by 3 papers in the map (data through 14 Oct 2026). Builds on 4 of its 53 references that are in the map. First posted on arXiv 21 Jul 2021.
Builds on
4 of 53 references.
References · 4
- 2017Model-Agnostic Meta-Learning for Fast Adaptation of Deep Networkscited by 4,897
- 2018Few-Shot Learning with Metric-Agnostic Conditional Embeddingscited by 40
- 2020Review: Deep Learning in Electron Microscopycited by 20
- 2018High throughput quantitative metallography for complex microstructures using deep learning: A case study in ultrahigh carbon steelcited by 19
Built on by
Citing papers per year: 2021: 1; 2022: 2.
3 papers.
- 2021An Automated Scanning Transmission Electron Microscope Guided by Sparse Data Analyticscited by 7
- 2022EasyMLServe: Easy Deployment of REST Machine Learning Servicescited by 1
- 2022Deep-learning-based prediction of nanoparticle phase transitions during in situ transmission electron microscopycited by 0
- 2022EasyMLServe: Easy Deployment of REST Machine Learning Services26 Nov 2022
- 2022Deep-learning-based prediction of nanoparticle phase transitions during in situ transmission electron microscopy23 May 2022
- 2021An Automated Scanning Transmission Electron Microscope Guided by Sparse Data Analytics30 Sep 2021