SinSEMI: A One-Shot Image Generation Model and Data-Efficient Evaluation Framework for Semiconductor Inspection Equipment
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Abstract (arXiv)
In the early stages of semiconductor equipment development, obtaining large quantities of raw optical images poses a significant challenge. This data scarcity hinder the advancement of AI-powered solutions in semiconductor manufacturing. To address this challenge, we introduce SinSEMI, a novel one-shot learning approach that generates diverse and highly realistic images from single optical image. SinSEMI employs a multi-scale flow-based model enhanced with LPIPS (Learned Perceptual Image Patch Similarity) energy guidance during sampling, ensuring both perceptual realism and output variety. We also introduce a comprehensive evaluation framework tailored for this application, which enables a thorough assessment using just two reference images. Through the evaluation against multiple one-shot generation techniques, we demonstrate SinSEMI's superior performance in visual quality, quantitative measures, and downstream tasks. Our experimental results demonstrate that SinSEMI-generated images achieve both high fidelity and meaningful diversity, making them suitable as training data for semiconductor AI applications.
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References · 20
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8 more
- 2022SinDDM: A Single Image Denoising Diffusion Modelcited by 60
- 2022SinFusion: Training Diffusion Models on a Single Image or Videocited by 58
- 2021Drop the GAN: In Defense of Patches Nearest Neighbors as Single Image Generative Modelscited by 51
- 2022SinDiffusion: Learning a Diffusion Model from a Single Natural Imagecited by 42
- 2022Generating natural images with direct Patch Distributions Matchingcited by 27
- 2022Few-shot Image Generation with Diffusion Modelscited by 21
- 2022Deep Learning-Based Defect Classification and Detection in SEM Imagescited by 14
- 2024Addressing Class Imbalance and Data Limitations in Advanced Node Semiconductor Defect Inspection: A Generative Approach for SEM Imagescited by 5
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