mlsanityData to 14 Oct 2026

Adaptive Bayesian Data-Driven Design of Reliable Solder Joints for Micro-electronic Devices

arXiv 2507.19663 ↗First posted 25 Jul 2025stat.ML cs.LG physics.comp-phcited by 0

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Abstract (arXiv)

Solder joint reliability related to failures due to thermomechanical loading is a critically important yet physically complex engineering problem. As a result, simulated behavior is oftentimes computationally expensive. In an increasingly data-driven world, the usage of efficient data-driven design schemes is a popular choice. Among them, Bayesian optimization (BO) with Gaussian process regression is one of the most important representatives. The authors argue that computational savings can be obtained from exploiting thorough surrogate modeling and selecting a design candidate based on multiple acquisition functions. This is feasible due to the relatively low computational cost, compared to the expensive simulation objective. This paper addresses the shortcomings in the adjacent literature by providing and implementing a novel heuristic framework to perform BO with adaptive hyperparameters across the various optimization iterations. Adaptive BO is subsequently compared to regular BO when faced with synthetic objective minimization problems. The results show the efficiency of adaptive BO when compared any worst-performing regular Bayesian schemes. As an engineering use case, the solder joint reliability problem is tackled by minimizing the accumulated non-linear creep strain under a cyclic thermal load. Results show that adaptive BO outperforms regular BO by 3% on average at any given computational budget threshold, critically saving half of the computational expense budget. This practical result underlines the methodological potential of the adaptive Bayesian data-driven methodology to achieve better results and cut optimization-related expenses. Lastly, in order to promote the reproducibility of the results, the data-driven implementations are made available on an open-source basis.

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References · 12

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  12. 2022Are you using test log-likelihood correctly?cited by 8

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