Zero Memory Overhead Approach for Protecting Vision Transformer Parameters
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Abstract (arXiv)
Vision Transformers (ViTs) have demonstrated superior performance over Convolutional Neural Networks (CNNs) in various vision-related tasks such as classification, object detection, and segmentation due to their use of self-attention mechanisms. As ViTs become more popular in safety-critical applications like autonomous driving, ensuring their correct functionality becomes essential, especially in the presence of bit-flip faults in their parameters stored in memory. In this paper, a fault tolerance technique is introduced to protect ViT parameters against bit-flip faults with zero memory overhead. Since the least significant bits of parameters are not critical for model accuracy, replacing the LSB with a parity bit provides an error detection mechanism without imposing any overhead on the model. When faults are detected, affected parameters are masked by zeroing out, as most parameters in ViT models are near zero, effectively preventing accuracy degradation. This approach enhances reliability across ViT models, improving the robustness of parameters to bit-flips by up to three orders of magnitude, making it an effective zero-overhead solution for fault tolerance in critical applications.
Key facts. Cited by 1 paper in the map (data through 14 Oct 2026). Builds on 7 of its 17 references that are in the map. First posted on arXiv 4 Jul 2025.
Builds on
7 of 17 references.
References · 7
- 2020An Image is Worth 16x16 Words: Transformers for Image Recognition at Scalecited by 30,186
- 2021Swin Transformer: Hierarchical Vision Transformer using Shifted Windowscited by 12,139
- 2021Transformers in Vision: A Surveycited by 1,013
- 2021Going deeper with Image Transformerscited by 764
- 2021DeepViT: Towards Deeper Vision Transformercited by 289
- 2023Soft Error Reliability Analysis of Vision Transformerscited by 10
- 2023ALBERTA: ALgorithm-Based Error Resilience in Transformer Architecturescited by 3
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