Active Sequential Two-Sample Testing

A two-sample hypothesis test is a statistical procedure used to determine whether the distributions generating two samples are identical. We consider the two-sample testing problem in a new scenario where the sample measurements (or sample features) are inexpensive to access, but their group memberships (or labels) are costly. To address the problem, we devise the first active sequential two-sample testing framework that not only sequentially but also actively queries. Our test statistic is a likelihood ratio where one likelihood is found by maximization over all class priors, and the other is provided by a probabilistic classification model. The classification model is adaptively updated and used to predict where the (unlabelled) features have a high dependency on labels; labeling the ``high-dependency'' features leads to the increased power of the proposed testing framework. In theory, we provide the proof that our framework produces an anytime-valid p-value. In addition, we characterize the proposed framework's gain in testing power by analyzing the mutual information between the feature and label variables in asymptotic and finite-sample scenarios. In practice, we introduce an instantiation of our framework and evaluate it using several experiments; the experiments on the synthetic, MNIST, and application-specific datasets demonstrate that the testing power of the instantiated active sequential test significantly increases while the Type I error is under control.