Learning Sinkhorn divergences for supervised change point detection
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Abstract (arXiv)
Many modern applications require detecting change points in complex sequential data. Most existing methods for change point detection are unsupervised and, as a consequence, lack any information regarding what kind of changes we want to detect or if some kinds of changes are safe to ignore. This often results in poor change detection performance. We present a novel change point detection framework that uses true change point instances as supervision for learning a ground metric such that Sinkhorn divergences can be then used in two-sample tests on sliding windows to detect change points in an online manner. Our method can be used to learn a sparse metric which can be useful for both feature selection and interpretation in high-dimensional change point detection settings. Experiments on simulated as well as real world sequences show that our proposed method can substantially improve change point detection performance over existing unsupervised change point detection methods using only few labeled change point instances.
Key facts. Cited by 1 paper in the map (data through 7 Oct 2026). Builds on 8 of its 33 references that are in the map. First posted on arXiv 8 Feb 2022.
Builds on
8 of 33 references.
References · 8
- 2013Sinkhorn Distances: Lightspeed Computation of Optimal Transportation Distancescited by 2,277
- 2015On Wasserstein Two Sample Testing and Related Families of Nonparametric Testscited by 165
- 2019Subspace Robust Wasserstein Distancescited by 89
- 2021Mine Your Own vieW: Self-Supervised Learning Through Across-Sample Predictioncited by 36
- 2019Kernel Change-point Detection with Auxiliary Deep Generative Modelscited by 32
- 2020Change Point Detection in Time Series Data using Autoencoders with a Time-Invariant Representationcited by 21
- 2020Two-sample Test using Projected Wasserstein Distancecited by 17
- 2019Optimal Transport Based Change Point Detection and Time Series Segment Clusteringcited by 8
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Citing papers per year: 2023: 1.
1 paper.