Ensemble learning and iterative training (ELIT) machine learning: applications towards uncertainty quantification and automated experiment in atom-resolved microscopy
Not on the map. Why?
Abstract (arXiv)
Deep learning has emerged as a technique of choice for rapid feature extraction across imaging disciplines, allowing rapid conversion of the data streams to spatial or spatiotemporal arrays of features of interest. However, applications of deep learning in experimental domains are often limited by the out-of-distribution drift between the experiments, where the network trained for one set of imaging conditions becomes sub-optimal for different ones. This limitation is particularly stringent in the quest to have an automated experiment setting, where retraining or transfer learning becomes impractical due to the need for human intervention and associated latencies. Here we explore the reproducibility of deep learning for feature extraction in atom-resolved electron microscopy and introduce workflows based on ensemble learning and iterative training to greatly improve feature detection. This approach both allows incorporating uncertainty quantification into the deep learning analysis and also enables rapid automated experimental workflows where retraining of the network to compensate for out-of-distribution drift due to subtle change in imaging conditions is substituted for a human operator or programmatic selection of networks from the ensemble. This methodology can be further applied to machine learning workflows in other imaging areas including optical and chemical imaging.
Key facts. Cited by 3 papers in the map (data through 14 Oct 2026). Builds on 0 of its 5 references that are in the map. First posted on arXiv 21 Jan 2021.
Builds on
0 of 5 references.
No references here yet.
Built on by
Citing papers per year: 2021: 2; 2022: 0; 2023: 1.
3 papers.
- 2021Finding simplicity: unsupervised discovery of features, patterns, and order parameters via shift-invariant variational autoencoderscited by 4
- 2021Automated and Autonomous Experiment in Electron and Scanning Probe Microscopycited by 1
- 2023Detecting Atomic Scale Surface Defects in STM of TMDs with Ensemble Deep Learningcited by 0
- 2023Detecting Atomic Scale Surface Defects in STM of TMDs with Ensemble Deep Learning8 Dec 2023
- 2021Finding simplicity: unsupervised discovery of features, patterns, and order parameters via shift-invariant variational autoencoders23 Jun 2021
- 2021Automated and Autonomous Experiment in Electron and Scanning Probe Microscopy22 Mar 2021