Quantum Computing Assisted Deep Learning for Fault Detection and Diagnosis in Industrial Process Systems
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Abstract (arXiv)
Quantum computing (QC) and deep learning techniques have attracted widespread attention in the recent years. This paper proposes QC-based deep learning methods for fault diagnosis that exploit their unique capabilities to overcome the computational challenges faced by conventional data-driven approaches performed on classical computers. Deep belief networks are integrated into the proposed fault diagnosis model and are used to extract features at different levels for normal and faulty process operations. The QC-based fault diagnosis model uses a quantum computing assisted generative training process followed by discriminative training to address the shortcomings of classical algorithms. To demonstrate its applicability and efficiency, the proposed fault diagnosis method is applied to process monitoring of continuous stirred tank reactor (CSTR) and Tennessee Eastman (TE) process. The proposed QC-based deep learning approach enjoys superior fault detection and diagnosis performance with obtained average fault detection rates of 79.2% and 99.39% for CSTR and TE process, respectively.
Key facts. Cited by 5 papers in the map (data through 7 Oct 2026). First posted on arXiv 29 Feb 2020.
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Citing papers per year: 2022: 1; 2023: 0; 2024: 2; 2025: 2.
5 papers.
- 2022Semiconductor Defect Detection by Hybrid Classical-Quantum Deep Learningcited by 16
- 2024Generative AI and Process Systems Engineering: The Next Frontiercited by 8
- 2024Autoencoder-assisted Feature Ensemble Net for Incipient Faultscited by 0
- 2025Quantum enhanced ensemble GANs for anomaly detection in continuous biomanufacturingcited by 0
- 2025Fraud detection in credit card transactions using Quantum-Assisted Restricted Boltzmann Machinescited by 0
- 2025Fraud detection in credit card transactions using Quantum-Assisted Restricted Boltzmann Machines19 Dec 2025
- 2025Quantum enhanced ensemble GANs for anomaly detection in continuous biomanufacturing29 Aug 2025
- 2024Autoencoder-assisted Feature Ensemble Net for Incipient Faults22 Apr 2024
- 2024Generative AI and Process Systems Engineering: The Next Frontier15 Feb 2024
- 2022Semiconductor Defect Detection by Hybrid Classical-Quantum Deep Learning6 Aug 2022