Structured Point Cloud Data Analysis via Regularized Tensor Regression for Process Modeling and Optimization
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Abstract (arXiv)
Advanced 3D metrology technologies such as Coordinate Measuring Machine (CMM) and laser 3D scanners have facilitated the collection of massive point cloud data, beneficial for process monitoring, control and optimization. However, due to their high dimensionality and structure complexity, modeling and analysis of point clouds are still a challenge. In this paper, we utilize multilinear algebra techniques and propose a set of tensor regression approaches to model the variational patterns of point clouds and to link them to process variables. The performance of the proposed methods is evaluated through simulations and a real case study of turning process optimization.
Key facts. Cited by 8 papers in the map (data through 14 Oct 2026). First posted on arXiv 26 Jul 2018.
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Citing papers per year: 2021: 1; 2022: 1; 2023: 3; 2024: 1; 2025: 2.
8 papers.
- 2021Deep Multistage Multi-Task Learning for Quality Prediction of Multistage Manufacturing Systemscited by 3
- 2023Federated Multilinear Principal Component Analysis with Applications in Prognosticscited by 3
- 2023Personalized Tucker Decomposition: Modeling Commonality and Peculiarity on Tensor Datacited by 2
- 2025Tensor-on-tensor Regression Neural Networks for Process Modeling with High-dimensional Datacited by 2
- 2022ANTLER: Bayesian Nonlinear Tensor Learning and Modeler for Unstructured, Varying-Size Point Cloud Datacited by 0
- 2023Maximum Covariance Unfolding Regression: A Novel Covariate-based Manifold Learning Approach for Point Cloud Datacited by 0
- 2024Tensor-based process control and monitoring for semiconductor manufacturing with unstable disturbancescited by 0
- 2025Generalized Nonnegative Structured Kruskal Tensor Regressioncited by 0
- 2025Tensor-on-tensor Regression Neural Networks for Process Modeling with High-dimensional Data6 Oct 2025
- 2025Generalized Nonnegative Structured Kruskal Tensor Regression24 Sep 2025
- 2024Tensor-based process control and monitoring for semiconductor manufacturing with unstable disturbances31 Jan 2024
- 2023Federated Multilinear Principal Component Analysis with Applications in Prognostics11 Dec 2023
- 2023Personalized Tucker Decomposition: Modeling Commonality and Peculiarity on Tensor Data7 Sep 2023
- 2023Maximum Covariance Unfolding Regression: A Novel Covariate-based Manifold Learning Approach for Point Cloud Data31 Mar 2023
- 2022ANTLER: Bayesian Nonlinear Tensor Learning and Modeler for Unstructured, Varying-Size Point Cloud Data25 Feb 2022
- 2021Deep Multistage Multi-Task Learning for Quality Prediction of Multistage Manufacturing Systems17 May 2021