# A Physics-Guided Transformer Framework for Electromigration Analysis in Multi-Segment Interconnects

arXiv: https://arxiv.org/abs/2610.06464 · HTML: https://mlsanity.com/paper/2610.06464/

## Key facts

- No citing papers in the map yet (data through 14 Oct 2026).
- Builds on 0 of its 12 references that are in the map.
- First posted on arXiv 5 Oct 2026.

## Abstract (arXiv)

As technology scales to smaller nodes, increasing current densities make electromigration (EM) one of the dominant reliability challenges in on-chip interconnects. Accurate transient stress analysis is needed to identify wires susceptible to EM degradation, but applying physics-based solvers across many interconnects remains computationally expensive. This paper proposes a physics-guided transformer framework for fast EM stress prediction in multi-segment interconnect lines. The framework converts each line into geometry- and DC-aware segment tokens and uses transformer attention to capture line-level context. A lightweight query decoder then predicts stress at selected locations and time instants. The model is trained with an objective that combines normalized supervised regression, linewise relative-L2 loss, and physics-guided continuity and terminal-flux terms. Experiments on IBM power grid benchmarks show that the proposed model achieves relative-L2 error below 8% and reaches up to 2459.68× speedup compared with the matrix exponential~solver.