# Real-Time Atomic-Resolution Electron Phase Imaging without Probe Calibration via Ptychography-Supervised Learning

arXiv: https://arxiv.org/abs/2609.25684 · HTML: https://mlsanity.com/paper/2609.25684/

## Key facts

- No citing papers in the map yet (data through 14 Oct 2026).
- Builds on 12 of its 33 references that are in the map.
- First posted on arXiv 22 Sep 2026.

## Builds on (most cited first, 12 of 12)

- [Attention Is All You Need](https://mlsanity.com/paper/1706.03762/) (2017)
- [An Image is Worth 16x16 Words: Transformers for Image Recognition at Scale](https://mlsanity.com/paper/2010.11929/) (2020)
- [Squeeze-and-Excitation Networks](https://mlsanity.com/paper/1709.01507/) (2017)
- [Dropout as a Bayesian Approximation: Representing Model Uncertainty in Deep Learning](https://mlsanity.com/paper/1506.02142/) (2015)
- [DeepLab: Semantic Image Segmentation with Deep Convolutional Nets, Atrous Convolution, and Fully Connected CRFs](https://mlsanity.com/paper/1606.00915/) (2016)
- [Deep Image Prior](https://mlsanity.com/paper/1711.10925/) (2017)
- [Deep Learning Techniques for Inverse Problems in Imaging](https://mlsanity.com/paper/2005.06001/) (2020)
- [On instabilities of deep learning in image reconstruction - Does AI come at a cost?](https://mlsanity.com/paper/1902.05300/) (2019)
- [On the use of deep learning for phase recovery](https://mlsanity.com/paper/2308.00942/) (2023)
- [Deep learning at the edge enables real-time streaming ptychographic imaging](https://mlsanity.com/paper/2209.09408/) (2022)
- [A Physics-Inspired Deep Learning Framework with Polar Coordinate Attention for Ptychographic Imaging](https://mlsanity.com/paper/2412.06806/) (2024)
- [Using a modified double deep image prior for crosstalk mitigation in multislice ptychography](https://mlsanity.com/paper/2102.00869/) (2021)

## Abstract (arXiv)

Atomic-scale phase imaging is central to resolving defects, interfaces, and weakly scattering atoms that govern the behavior of nanoscale materials. Electron ptychography delivers sub-aangstr"om phase sensitivity but remains an offline technique, because its iterative reconstruction is computationally expensive and sensitive to experimental calibration, preventing live use during data acquisition. Here, a ptychography-supervised local inference framework is presented that converts four-dimensional scanning transmission electron microscopy (4D-STEM) into an acquisition-compatible phase-imaging workflow. Physics-constrained reference phase maps reconstructed from a single experimental AuPd dataset serve as teacher labels for a compact model that predicts local phase patches directly from diffraction measurements, without explicit probe input or online iterative optimization. Full-field images are assembled by deterministic overlap stitching. The workflow reaches an online latency of about 0.27 ms per probe position and a throughput of about 20,000 positions per second, an approximately 1,000-fold speed-up over GPU-accelerated ePIE, while preserving atomic-scale lattice contrast and reciprocal-space fidelity. Without fine-tuning, the same model transfers across materials (WS2), defocus conditions (high-entropy alloy nanoparticles), and instruments (hBN at 300 kV). The approach amortizes ptychographic redundancy into a fast, generalizable workflow that enables real-time atomic-scale phase imaging for materials microscopy.
