# LUMIN: Lightweight Universal Manufacturing Inspection Network for Anomaly Detection

arXiv: https://arxiv.org/abs/2609.04775 · HTML: https://mlsanity.com/paper/2609.04775/

## Key facts

- No citing papers in the map yet (data through 14 Oct 2026).
- Builds on 13 of its 17 references that are in the map.
- First posted on arXiv 4 Sep 2026.

## Builds on (most cited first, 13 of 13)

- [Attention Is All You Need](https://mlsanity.com/paper/1706.03762/) (2017)
- [Learning Transferable Visual Models From Natural Language Supervision](https://mlsanity.com/paper/2103.00020/) (2021)
- [Optuna: A Next-generation Hyperparameter Optimization Framework](https://mlsanity.com/paper/1907.10902/) (2019)
- [DINOv3](https://mlsanity.com/paper/2508.10104/) (2025)
- [Towards Total Recall in Industrial Anomaly Detection](https://mlsanity.com/paper/2106.08265/) (2021)
- [SPot-the-Difference Self-Supervised Pre-training for Anomaly Detection and Segmentation](https://mlsanity.com/paper/2207.14315/) (2022)
- [WinCLIP: Zero-/Few-Shot Anomaly Classification and Segmentation](https://mlsanity.com/paper/2303.14814/) (2023)
- [AnomalyCLIP: Object-agnostic Prompt Learning for Zero-shot Anomaly Detection](https://mlsanity.com/paper/2310.18961/) (2023)
- [VT-ADL: A Vision Transformer Network for Image Anomaly Detection and Localization](https://mlsanity.com/paper/2104.10036/) (2021)
- [Segmentation-Based Deep-Learning Approach for Surface-Defect Detection](https://mlsanity.com/paper/1903.08536/) (2019)
- [Real-IAD: A Real-World Multi-View Dataset for Benchmarking Versatile Industrial Anomaly Detection](https://mlsanity.com/paper/2403.12580/) (2024)
- [VisualAD: Language-Free Zero-Shot Anomaly Detection via Vision Transformer](https://mlsanity.com/paper/2603.07952/) (2026)
- [One Language-Free Foundation Model Is Enough for Universal Vision Anomaly Detection](https://mlsanity.com/paper/2601.05552/) (2026)

## Abstract (arXiv)

Industrial anomaly detection faces two engineering bottlenecks: memory bank construction latency and inference efficiency. Traditional sampling algorithms (Farthest Point Sampling, K-Means, etc.) rely on numerous backbone forward passes and iterative distance computations, with construction times ranging from minutes to hours; heavy computation components such as multi-scale feature extraction struggle to meet the millisecond-level real-time requirements of production lines. This paper focuses on sampling efficiency and inference optimization for industrial deployment with two core contributions: (1) PSP (Plugin Sampler Pipeline)---a four-stage adaptive memory bank sampling pipeline based on 18-dimensional pixel metadata and five complementary visual plugins. PSP completes all sampling with zero backbone forward passes; coarse filtering is sub-second numerical sorting, and metadata extraction is a one-time offline cost. PSP supports progressive deployment and incremental updates. (2) Two engineering optimization strategies---parallel memory bank similarity computation (reducing inference memory and latency by over 95%) and stratified pixel sampling for large-scale evaluation (reducing computation time by 20× while keeping metrics stable). As a vehicle for validation, we introduce LUMIN (Lightweight Universal Manufacturing Inspection Network) with extreme segmentation-head compression, systematically exploring the accuracy-efficiency frontier against strong baselines. Experiments on five benchmarks demonstrate that PSP matches state-of-the-art sampling accuracy at near-random construction cost (341× faster than FPS), while inference optimizations reduce evaluation time by 20× with negligible accuracy loss.