# A Knowledge-Driven LLM-Based Decision-Support System for Explainable Defect Analysis and Mitigation Guidance in Laser Powder Bed Fusion

arXiv: https://arxiv.org/abs/2605.01100 · HTML: https://mlsanity.com/paper/2605.01100/

## Key facts

- No citing papers in the map yet (data through 14 Oct 2026).
- Builds on 0 of its 32 references that are in the map.
- First posted on arXiv 1 May 2026.

## Abstract (arXiv)

This work presents a knowledge-driven decision-support system that integrates structured defect knowledge with LLM-based reasoning to provide explainable defect diagnosis and mitigation guidance in manufacturing, using LPBF as a representative, safety-critical case study. The proposed ontology-integrated LLM-based decision support system for LPBF defect analysis and mitigation guidance is built on a knowledge base containing 27 known LPBF defect types organized into hierarchical categories and causal relationships. The developed system supports fuzzy natural language queries for systematic knowledge retrieval, literature-supported explanation of defects, and guidance on defect causes and mitigation strategies derived from encoded process knowledge. Furthermore, a multimodal image-assessment module based on foundation models enables descriptor-guided interpretation of representative microscopic defect images through semantic alignment scoring. The proposed framework was evaluated through qualitative comparisons with general-purpose vision-language models, an ablation study, and an inter-rater reliability analysis. Evaluation on the literature-derived dataset showed that the fully integrated configuration outperformed the other three evaluated system configurations, achieving a macro-average F1 score of 0.808. Additionally, inter-rater reliability analysis using Cohen's kappa indicated substantial agreement between the model outputs and the literature-derived reference labels. These findings suggest that ontology-guided knowledge representation can improve the consistency, interpretability, and practical usefulness of LLM-assisted LPBF defect analysis.