# Efficient Mutation Testing of Quantum Machine Learning Models

arXiv: https://arxiv.org/abs/2605.00107 · HTML: https://mlsanity.com/paper/2605.00107/

## Key facts

- No citing papers in the map yet (data through 14 Oct 2026).
- Builds on 6 of its 20 references that are in the map.
- First posted on arXiv 30 Apr 2026.

## Builds on (most cited first, 6 of 6)

- [Fashion-MNIST: a Novel Image Dataset for Benchmarking Machine Learning Algorithms](https://mlsanity.com/paper/1708.07747/) (2017)
- [Deep Learning for Classical Japanese Literature](https://mlsanity.com/paper/1812.01718/) (2018)
- [DeepMutation: Mutation Testing of Deep Learning Systems](https://mlsanity.com/paper/1805.05206/) (2018)
- [Qiskit Machine Learning: an open-source library for quantum machine learning tasks at scale on quantum hardware and classical simulators](https://mlsanity.com/paper/2505.17756/) (2025)
- [Detecting Adversarial Samples for Deep Neural Networks through Mutation Testing](https://mlsanity.com/paper/1805.05010/) (2018)
- [Quantum Circuit Mutants: Empirical Analysis and Recommendations](https://mlsanity.com/paper/2311.16913/) (2023)

## Abstract (arXiv)

Quantum machine learning integrates the strengths of quantum computing and machine learning, enabling models to learn complex features using fewer parameters than their classical counterparts. Due to the increasing complexity of quantum machine learning models, it is necessary to verify that the implementation of these models satisfy the design specification and be free of bugs and faults. Mutation testing is a promising avenue to identify faulty quantum circuits that do not meet design specifications or contain defects by intentionally inserting faults into the quantum circuit. It is necessary to define mutation operations to inject faults into quantum circuits to ensure that a test suite is robust enough to evaluate an implementation against its design specification. In this paper, we extend mutation testing to quantum machine learning applications, primarily quantum neural network models. Specifically, this paper makes two important contributions. We define new mutation operations for efficient fault insertion compared to state-of-the-art approaches. We also present a directed mutation generation technique to reduce redundant mutant circuits. Extensive experimental evaluation demonstrates that our approach generates a more diverse and representative set of mutants, effectively addressing faults that traditional techniques fail to expose.