# A Mixture of Experts Foundation Model for Scanning Electron Microscopy Image Analysis

arXiv: https://arxiv.org/abs/2604.05960 · HTML: https://mlsanity.com/paper/2604.05960/

## Key facts

- No citing papers in the map yet (data through 14 Oct 2026).
- Builds on 15 of its 54 references that are in the map.
- First posted on arXiv 7 Apr 2026.

## Builds on (most cited first, 15 of 15)

- [An Image is Worth 16x16 Words: Transformers for Image Recognition at Scale](https://mlsanity.com/paper/2010.11929/) (2020)
- [The Unreasonable Effectiveness of Deep Features as a Perceptual Metric](https://mlsanity.com/paper/1801.03924/) (2018)
- [ImageNet Large Scale Visual Recognition Challenge](https://mlsanity.com/paper/1409.0575/) (2014)
- [Masked Autoencoders Are Scalable Vision Learners](https://mlsanity.com/paper/2111.06377/) (2021)
- [Emerging Properties in Self-Supervised Vision Transformers](https://mlsanity.com/paper/2104.14294/) (2021)
- [On the Opportunities and Risks of Foundation Models](https://mlsanity.com/paper/2108.07258/) (2021)
- [Outrageously Large Neural Networks: The Sparsely-Gated Mixture-of-Experts Layer](https://mlsanity.com/paper/1701.06538/) (2017)
- [Switch Transformers: Scaling to Trillion Parameter Models with Simple and Efficient Sparsity](https://mlsanity.com/paper/2101.03961/) (2021)
- [GShard: Scaling Giant Models with Conditional Computation and Automatic Sharding](https://mlsanity.com/paper/2006.16668/) (2020)
- [An Empirical Study of Training Self-Supervised Vision Transformers](https://mlsanity.com/paper/2104.02057/) (2021)
- [A Survey on Contrastive Self-supervised Learning](https://mlsanity.com/paper/2011.00362/) (2020)
- [Noise2Noise: Learning Image Restoration without Clean Data](https://mlsanity.com/paper/1803.04189/) (2018)
- [Noise2Void - Learning Denoising from Single Noisy Images](https://mlsanity.com/paper/1811.10980/) (2018)
- [Deep multi-scale video prediction beyond mean square error](https://mlsanity.com/paper/1511.05440/) (2015)
- [DeepFocus: Fast focus and astigmatism correction for electron microscopy](https://mlsanity.com/paper/2305.04977/) (2023)

## Abstract (arXiv)

Scanning Electron Microscopy (SEM) is indispensable in modern materials science, enabling high-resolution imaging across a wide range of structural, chemical, and functional investigations. However, SEM imaging remains constrained by task-specific models and labor-intensive acquisition processes that limit its scalability across diverse applications. Here, we introduce the first foundation model for SEM images, pretrained on a large corpus of multi-instrument, multi-condition scientific micrographs, enabling generalization across diverse material systems and imaging conditions. Leveraging a self-supervised transformer architecture, our model learns rich and transferable representations that can be fine-tuned or adapted to a wide range of downstream tasks. As a compelling demonstration, we focus on defocus-to-focus image translation-an essential yet underexplored challenge in automated microscopy pipelines. Our method not only restores focused detail from defocused inputs without paired supervision but also outperforms state-of-the-art techniques across multiple evaluation metrics. This work lays the groundwork for a new class of adaptable SEM models, accelerating materials discovery by bridging foundational representation learning with real-world imaging needs.