# Exploring "Many in Few" and "Few in Many" Properties in Long-Tailed, Highly-Imbalanced IC Defect Classification

arXiv: https://arxiv.org/abs/2510.19463 · HTML: https://mlsanity.com/paper/2510.19463/

## Key facts

- No citing papers in the map yet (data through 14 Oct 2026).
- Builds on 41 of its 73 references that are in the map.
- First posted on arXiv 22 Oct 2025.

## Builds on (most cited first, 30 of 41)

- [Attention Is All You Need](https://mlsanity.com/paper/1706.03762/) (2017)
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- [A Simple Framework for Contrastive Learning of Visual Representations](https://mlsanity.com/paper/2002.05709/) (2020)
- [Distilling the Knowledge in a Neural Network](https://mlsanity.com/paper/1503.02531/) (2015)
- [Squeeze-and-Excitation Networks](https://mlsanity.com/paper/1709.01507/) (2017)
- [Prototypical Networks for Few-shot Learning](https://mlsanity.com/paper/1703.05175/) (2017)
- [CBAM: Convolutional Block Attention Module](https://mlsanity.com/paper/1807.06521/) (2018)
- [RandAugment: Practical automated data augmentation with a reduced search space](https://mlsanity.com/paper/1909.13719/) (2019)
- [Class-Balanced Loss Based on Effective Number of Samples](https://mlsanity.com/paper/1901.05555/) (2019)
- [Learning Imbalanced Datasets with Label-Distribution-Aware Margin Loss](https://mlsanity.com/paper/1906.07413/) (2019)
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- [Large-Scale Long-Tailed Recognition in an Open World](https://mlsanity.com/paper/1904.05160/) (2019)
- [A systematic study of the class imbalance problem in convolutional neural networks](https://mlsanity.com/paper/1710.05381/) (2017)
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- [Balanced Meta-Softmax for Long-Tailed Visual Recognition](https://mlsanity.com/paper/2007.10740/) (2020)
- [Long-tailed Recognition by Routing Diverse Distribution-Aware Experts](https://mlsanity.com/paper/2010.01809/) (2020)
- [Parametric Contrastive Learning](https://mlsanity.com/paper/2107.12028/) (2021)
- [Improving Calibration for Long-Tailed Recognition](https://mlsanity.com/paper/2104.00466/) (2021)
- [Distribution Alignment: A Unified Framework for Long-tail Visual Recognition](https://mlsanity.com/paper/2103.16370/) (2021)
- [Learning From Multiple Experts: Self-paced Knowledge Distillation for Long-tailed Classification](https://mlsanity.com/paper/2001.01536/) (2020)
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- [Targeted Supervised Contrastive Learning for Long-Tailed Recognition](https://mlsanity.com/paper/2111.13998/) (2021)
- [Inducing Neural Collapse in Imbalanced Learning: Do We Really Need a Learnable Classifier at the End of Deep Neural Network?](https://mlsanity.com/paper/2203.09081/) (2022)
- [Self-Supervised Aggregation of Diverse Experts for Test-Agnostic Long-Tailed Recognition](https://mlsanity.com/paper/2107.09249/) (2021)
- [ACE: Ally Complementary Experts for Solving Long-Tailed Recognition in One-Shot](https://mlsanity.com/paper/2108.02385/) (2021)
- [Nested Collaborative Learning for Long-Tailed Visual Recognition](https://mlsanity.com/paper/2203.15359/) (2022)
- [Neural Collapse Inspired Attraction-Repulsion-Balanced Loss for Imbalanced Learning](https://mlsanity.com/paper/2204.08735/) (2022)
- [Neural Collapse in Deep Linear Networks: From Balanced to Imbalanced Data](https://mlsanity.com/paper/2301.00437/) (2023)

## Abstract (arXiv)

Despite significant advancements in deep classification techniques and in-lab automatic optical inspection models for long-tailed or highly imbalanced data, applying these approaches to real-world IC defect classification tasks remains challenging. This difficulty stems from two primary factors. First, real-world conditions, such as the high yield-rate requirements in the IC industry, result in data distributions that are far more skewed than those found in general public imbalanced datasets. Consequently, classifiers designed for open imbalanced datasets often fail to perform effectively in real-world scenarios. Second, real-world samples exhibit a mix of class-specific attributes and class-agnostic, domain-related features. This complexity adds significant difficulty to the classification process, particularly for highly imbalanced datasets. To address these challenges, this paper introduces the IC-Defect-14 dataset, a large, highly imbalanced IC defect image dataset sourced from AOI systems deployed in real-world IC production lines. This dataset is characterized by its unique "intra-class clusters" property, which presents two major challenges: large intra-class diversity and high inter-class similarity. These characteristics, rarely found simultaneously in existing public datasets, significantly degrade the performance of current state-of-the-art classifiers for highly imbalanced data. To tackle this challenge, we propose ReCAME-Net, which follows a multi-expert classifier framework and integrates a regional channel attention module, metric learning losses, a hard category mining strategy, and a knowledge distillation procedure. Extensive experimental evaluations demonstrate that ReCAME-Net outperforms previous state-of-the-art models on the IC-Defect-14 dataset while maintaining comparable performance and competitiveness on general public datasets.
