# BoardVision: Deployment-ready and Robust Motherboard Defect Detection with YOLO+Faster-RCNN Ensemble

arXiv: https://arxiv.org/abs/2510.14389 · HTML: https://mlsanity.com/paper/2510.14389/

## Key facts

- No citing papers in the map yet (data through 14 Oct 2026).
- Builds on 6 of its 23 references that are in the map.
- First posted on arXiv 16 Oct 2025.

## Builds on (most cited first, 6 of 6)

- [Microsoft COCO: Common Objects in Context](https://mlsanity.com/paper/1405.0312/) (2014)
- [Faster R-CNN: Towards Real-Time Object Detection with Region Proposal Networks](https://mlsanity.com/paper/1506.01497/) (2015)
- [YOLOv7: Trainable bag-of-freebies sets new state-of-the-art for real-time object detectors](https://mlsanity.com/paper/2207.02696/) (2022)
- [Online PCB Defect Detector On A New PCB Defect Dataset](https://mlsanity.com/paper/1902.06197/) (2019)
- [Optimizing YOLOv7 for Semiconductor Defect Detection](https://mlsanity.com/paper/2302.09565/) (2023)
- [Enhancing Printed Circuit Board Defect Detection through Ensemble Learning](https://mlsanity.com/paper/2409.09555/) (2024)

## Abstract (arXiv)

Motherboard defect detection is critical for ensuring reliability in high-volume electronics manufacturing. While prior research in PCB inspection has largely targeted bare-board or trace-level defects, assembly-level inspection of full motherboards inspection remains underexplored. In this work, we present BoardVision, a reproducible framework for detecting assembly-level defects such as missing screws, loose fan wiring, and surface scratches. We benchmark two representative detectors - YOLOv7 and Faster R-CNN, under controlled conditions on the MiracleFactory motherboard dataset, providing the first systematic comparison in this domain. To mitigate the limitations of single models, where YOLO excels in precision but underperforms in recall and Faster R-CNN shows the reverse, we propose a lightweight ensemble, Confidence-Temporal Voting (CTV Voter), that balances precision and recall through interpretable rules. We further evaluate robustness under realistic perturbations including sharpness, brightness, and orientation changes, highlighting stability challenges often overlooked in motherboard defect detection. Finally, we release a deployable GUI-driven inspection tool that bridges research evaluation with operator usability. Together, these contributions demonstrate how computer vision techniques can transition from benchmark results to practical quality assurance for assembly-level motherboard manufacturing.