# A Real-Time On-Device Defect Detection Framework for Laser Power-Meter Sensors via Unsupervised Learning

arXiv: https://arxiv.org/abs/2509.20946 · HTML: https://mlsanity.com/paper/2509.20946/

## Key facts

- No citing papers in the map yet (data through 14 Oct 2026).
- Builds on 10 of its 15 references that are in the map.
- First posted on arXiv 25 Sep 2025.

## Builds on (most cited first, 10 of 10)

- [A Style-Based Generator Architecture for Generative Adversarial Networks](https://mlsanity.com/paper/1812.04948/) (2018)
- [Analyzing and Improving the Image Quality of StyleGAN](https://mlsanity.com/paper/1912.04958/) (2019)
- [Alias-Free Generative Adversarial Networks](https://mlsanity.com/paper/2106.12423/) (2021)
- [Towards Total Recall in Industrial Anomaly Detection](https://mlsanity.com/paper/2106.08265/) (2021)
- [PaDiM: a Patch Distribution Modeling Framework for Anomaly Detection and Localization](https://mlsanity.com/paper/2011.08785/) (2020)
- [Unsupervised Anomaly Detection with Generative Adversarial Networks to Guide Marker Discovery](https://mlsanity.com/paper/1703.05921/) (2017)
- [GANomaly: Semi-Supervised Anomaly Detection via Adversarial Training](https://mlsanity.com/paper/1805.06725/) (2018)
- [Same Same But DifferNet: Semi-Supervised Defect Detection with Normalizing Flows](https://mlsanity.com/paper/2008.12577/) (2020)
- [Segmentation-Based Deep-Learning Approach for Surface-Defect Detection](https://mlsanity.com/paper/1903.08536/) (2019)
- [Fully Convolutional Cross-Scale-Flows for Image-based Defect Detection](https://mlsanity.com/paper/2110.02855/) (2021)

## Abstract (arXiv)

We present an automated vision-based system for defect detection and classification of laser power meter sensor coatings. Our approach addresses the critical challenge of identifying coating defects such as thermal damage and scratches that can compromise laser energy measurement accuracy in medical and industrial applications. The system employs an unsupervised anomaly detection framework that trains exclusively on ``good'' sensor images to learn normal coating distribution patterns, enabling detection of both known and novel defect types without requiring extensive labeled defect datasets. Our methodology consists of three key components: (1) a robust preprocessing pipeline using Laplacian edge detection and K-means clustering to segment the area of interest, (2) synthetic data augmentation via StyleGAN2, and (3) a UFlow-based neural network architecture for multi-scale feature extraction and anomaly map generation. Experimental evaluation on 366 real sensor images demonstrates 93.8% accuracy on defective samples and 89.3% accuracy on good samples, with image-level AUROC of 0.957 and pixel-level AUROC of 0.961. The system provides potential annual cost savings through automated quality control and processing times of 0.5 seconds per image in on-device implementation.