# Virtual Sensing for Solder Layer Degradation and Temperature Monitoring in IGBT Modules

arXiv: https://arxiv.org/abs/2508.10515 · HTML: https://mlsanity.com/paper/2508.10515/

## Key facts

- No citing papers in the map yet (data through 14 Oct 2026).
- Builds on 4 of its 21 references that are in the map.
- First posted on arXiv 14 Aug 2025.

## Builds on (most cited first, 4 of 4)

- [PyTorch: An Imperative Style, High-Performance Deep Learning Library](https://mlsanity.com/paper/1912.01703/) (2019)
- [XGBoost: A Scalable Tree Boosting System](https://mlsanity.com/paper/1603.02754/) (2016)
- [Fast Graph Representation Learning with PyTorch Geometric](https://mlsanity.com/paper/1903.02428/) (2019)
- [Approximating the full-field temperature evolution in 3D electronic systems from randomized "Minecraft" systems](https://mlsanity.com/paper/2209.10369/) (2022)

## Abstract (arXiv)

Monitoring the degradation state of Insulated Gate Bipolar Transistor (IGBT) modules is essential for ensuring the reliability and longevity of power electronic systems, especially in safety-critical and high-performance applications. However, direct measurement of key degradation indicators - such as junction temperature, solder fatigue or delamination - remains challenging due to the physical inaccessibility of internal components and the harsh environment. In this context, machine learning-based virtual sensing offers a promising alternative by bridging the gap from feasible sensor placement to the relevant but inaccessible locations. This paper explores the feasibility of estimating the degradation state of solder layers, and the corresponding full temperature maps based on a limited number of physical sensors. Based on synthetic data of a specific degradation mode, we obtain a high accuracy in the estimation of the degraded solder area (1.17% mean absolute error), and are able to reproduce the surface temperature of the IGBT with a maximum relative error of 4.56% (corresponding to an average relative error of 0.37%).