# Silent Data Corruption by 10x Test Escapes Threatens Reliable Computing

arXiv: https://arxiv.org/abs/2508.01786 · HTML: https://mlsanity.com/paper/2508.01786/

## Key facts

- Cited by 3 papers in the map (data through 14 Oct 2026).
- First posted on arXiv 3 Aug 2025.

## Built on by (most cited first, 3 of 3)

- [GhostServe: A Lightweight Checkpointing System in the Shadow for Fault-Tolerant LLM Serving](https://mlsanity.com/paper/2605.00831/) (2026)
- [Report for NSF Workshop on AI for Electronic Design Automation](https://mlsanity.com/paper/2601.14541/) (2026)
- [AI+HW 2035: Shaping the Next Decade](https://mlsanity.com/paper/2603.05225/) (2026)

## Abstract (arXiv)

Too many defective compute chips are escaping existing manufacturing tests -- at least an order of magnitude more than industrial targets across all compute chip types in data centers. Silent data corruptions (SDCs) caused by test escapes, when left unaddressed, pose a major threat to reliable computing. We present a three-pronged approach outlining future directions for overcoming test escapes: (a) Quick diagnosis of defective chips directly from system-level incorrect behaviors. Such diagnosis is critical for gaining insights into why so many defective chips escape existing manufacturing testing. (b) In-field detection of defective chips. (c) New test experiments to understand the effectiveness of new techniques for detecting defective chips. These experiments must overcome the drawbacks and pitfalls of previous industrial test experiments and case studies.