# In-Memory Learning Automata Architecture using Y-Flash Cell

arXiv: https://arxiv.org/abs/2408.09456 · HTML: https://mlsanity.com/paper/2408.09456/

## Key facts

- Cited by 1 papers in the map (data through 14 Oct 2026).
- Builds on 2 of its 14 references that are in the map.
- First posted on arXiv 18 Aug 2024.

## Builds on (most cited first, 2 of 2)

- [The Tsetlin Machine -- A Game Theoretic Bandit Driven Approach to Optimal Pattern Recognition with Propositional Logic](https://mlsanity.com/paper/1804.01508/) (2018)
- [IMBUE: In-Memory Boolean-to-CUrrent Inference ArchitecturE for Tsetlin Machines](https://mlsanity.com/paper/2305.12914/) (2023)

## Built on by (most cited first, 1 of 1)

- [An All-digital 8.6-nJ/Frame 65-nm Tsetlin Machine Image Classification Accelerator](https://mlsanity.com/paper/2501.19347/) (2025)

## Abstract (arXiv)

The modern implementation of machine learning architectures faces significant challenges due to frequent data transfer between memory and processing units. In-memory computing, primarily through memristor-based analog computing, offers a promising solution to overcome this von Neumann bottleneck. In this technology, data processing and storage are located inside the memory. Here, we introduce a novel approach that utilizes floating-gate Y-Flash memristive devices manufactured with a standard 180 nm CMOS process. These devices offer attractive features, including analog tunability and moderate device-to-device variation; such characteristics are essential for reliable decision-making in ML applications. This paper uses a new machine learning algorithm, the Tsetlin Machine (TM), for in-memory processing architecture. The TM's learning element, Automaton, is mapped into a single Y-Flash cell, where the Automaton's range is transferred into the Y-Flash's conductance scope. Through comprehensive simulations, the proposed hardware implementation of the learning automata, particularly for Tsetlin machines, has demonstrated enhanced scalability and on-edge learning capabilities.
