# Few-Shot Testing: Estimating Uncertainty of Memristive Deep Neural Networks Using One Bayesian Test Vector

arXiv: https://arxiv.org/abs/2405.18894 · HTML: https://mlsanity.com/paper/2405.18894/

## Key facts

- No citing papers in the map yet (data through 14 Oct 2026).
- Builds on 14 of its 45 references that are in the map.
- First posted on arXiv 29 May 2024.

## Builds on (most cited first, 14 of 14)

- [Deep Residual Learning for Image Recognition](https://mlsanity.com/paper/1512.03385/) (2015)
- [U-Net: Convolutional Networks for Biomedical Image Segmentation](https://mlsanity.com/paper/1505.04597/) (2015)
- [Microsoft COCO: Common Objects in Context](https://mlsanity.com/paper/1405.0312/) (2014)
- [Densely Connected Convolutional Networks](https://mlsanity.com/paper/1608.06993/) (2016)
- [Rethinking the Inception Architecture for Computer Vision](https://mlsanity.com/paper/1512.00567/) (2015)
- [Fully Convolutional Networks for Semantic Segmentation](https://mlsanity.com/paper/1411.4038/) (2014)
- [MobileNetV2: Inverted Residuals and Linear Bottlenecks](https://mlsanity.com/paper/1801.04381/) (2018)
- [Unsupervised Representation Learning with Deep Convolutional Generative Adversarial Networks](https://mlsanity.com/paper/1511.06434/) (2015)
- [RepVGG: Making VGG-style ConvNets Great Again](https://mlsanity.com/paper/2101.03697/) (2021)
- [Association of genomic subtypes of lower-grade gliomas with shape features automatically extracted by a deep learning algorithm](https://mlsanity.com/paper/1906.03720/) (2019)
- [Fashion-Gen: The Generative Fashion Dataset and Challenge](https://mlsanity.com/paper/1806.08317/) (2018)
- [Noisy Machines: Understanding Noisy Neural Networks and Enhancing Robustness to Analog Hardware Errors Using Distillation](https://mlsanity.com/paper/2001.04974/) (2020)
- [On Functional Test Generation for Deep Neural Network IPs](https://mlsanity.com/paper/1911.11550/) (2019)
- [One-Shot Online Testing of Deep Neural Networks Based on Distribution Shift Detection](https://mlsanity.com/paper/2305.09348/) (2023)

## Abstract (arXiv)

The performance of deep learning algorithms such as neural networks (NNs) has increased tremendously recently, and they can achieve state-of-the-art performance in many domains. However, due to memory and computation resource constraints, implementing NNs on edge devices is a challenging task. Therefore, hardware accelerators such as computation-in-memory (CIM) with memristive devices have been developed to accelerate the most common operations, i.e., matrix-vector multiplication. However, due to inherent device properties, external environmental factors such as temperature, and an immature fabrication process, memristors suffer from various non-idealities, including defects and variations occurring during manufacturing and runtime. Consequently, there is a lack of complete confidence in the predictions made by the model. To improve confidence in NN predictions made by hardware accelerators in the presence of device non-idealities, in this paper, we propose a Bayesian test vector generation framework that can estimate the model uncertainty of NNs implemented on memristor-based CIM hardware. Compared to the conventional point estimate test vector generation method, our method is more generalizable across different model dimensions and requires storing only one test Bayesian vector in the hardware. Our method is evaluated on different model dimensions, tasks, fault rates, and variation noise to show that it can consistently achieve 100% coverage with only 0.024 MB of memory overhead.