# FARe: Fault-Aware GNN Training on ReRAM-based PIM Accelerators

arXiv: https://arxiv.org/abs/2401.10522 · HTML: https://mlsanity.com/paper/2401.10522/

## Key facts

- Cited by 2 papers in the map (data through 14 Oct 2026).
- Builds on 6 of its 19 references that are in the map.
- First posted on arXiv 19 Jan 2024.

## Builds on (most cited first, 6 of 6)

- [Open Graph Benchmark: Datasets for Machine Learning on Graphs](https://mlsanity.com/paper/2005.00687/) (2020)
- [Graph Neural Networks: A Review of Methods and Applications](https://mlsanity.com/paper/1812.08434/) (2018)
- [DNN+NeuroSim V2.0: An End-to-End Benchmarking Framework for Compute-in-Memory Accelerators for On-chip Training](https://mlsanity.com/paper/2003.06471/) (2020)
- [GraphR: Accelerating Graph Processing Using ReRAM](https://mlsanity.com/paper/1708.06248/) (2017)
- [PANTHER: A Programmable Architecture for Neural Network Training Harnessing Energy-efficient ReRAM](https://mlsanity.com/paper/1912.11516/) (2019)
- [Improving DNN Fault Tolerance using Weight Pruning and Differential Crossbar Mapping for ReRAM-based Edge AI](https://mlsanity.com/paper/2106.09166/) (2021)

## Built on by (most cited first, 2 of 2)

- [ProAct: Progressive Training for Hybrid Clipped Activation Function to Enhance Resilience of DNNs](https://mlsanity.com/paper/2406.06313/) (2024)
- [ThRIve: Thermally Robust CNN Inference via Low-Rank Adaptation in Heterogeneous PIM Architectures](https://mlsanity.com/paper/2607.17091/) (2026)

## Abstract (arXiv)

Resistive random-access memory (ReRAM)-based processing-in-memory (PIM) architecture is an attractive solution for training Graph Neural Networks (GNNs) on edge platforms. However, the immature fabrication process and limited write endurance of ReRAMs make them prone to hardware faults, thereby limiting their widespread adoption for GNN training. Further, the existing fault-tolerant solutions prove inadequate for effectively training GNNs in the presence of faults. In this paper, we propose a fault-aware framework referred to as FARe that mitigates the effect of faults during GNN training. FARe outperforms existing approaches in terms of both accuracy and timing overhead. Experimental results demonstrate that FARe framework can restore GNN test accuracy by 47.6% on faulty ReRAM hardware with a ~1% timing overhead compared to the fault-free counterpart.
