# Semiconductor Defect Pattern Classification by Self-Proliferation-and-Attention Neural Network

arXiv: https://arxiv.org/abs/2212.00345 · HTML: https://mlsanity.com/paper/2212.00345/

## Key facts

- Cited by 1 papers in the map (data through 14 Oct 2026).
- Builds on 16 of its 21 references that are in the map.
- First posted on arXiv 1 Dec 2022.

## Builds on (most cited first, 16 of 16)

- [Attention Is All You Need](https://mlsanity.com/paper/1706.03762/) (2017)
- [Deep Residual Learning for Image Recognition](https://mlsanity.com/paper/1512.03385/) (2015)
- [BERT: Pre-training of Deep Bidirectional Transformers for Language Understanding](https://mlsanity.com/paper/1810.04805/) (2018)
- [Very Deep Convolutional Networks for Large-Scale Image Recognition](https://mlsanity.com/paper/1409.1556/) (2014)
- [Batch Normalization: Accelerating Deep Network Training by Reducing Internal Covariate Shift](https://mlsanity.com/paper/1502.03167/) (2015)
- [MobileNetV2: Inverted Residuals and Linear Bottlenecks](https://mlsanity.com/paper/1801.04381/) (2018)
- [Squeeze-and-Excitation Networks](https://mlsanity.com/paper/1709.01507/) (2017)
- [MobileNets: Efficient Convolutional Neural Networks for Mobile Vision Applications](https://mlsanity.com/paper/1704.04861/) (2017)
- [Non-local Neural Networks](https://mlsanity.com/paper/1711.07971/) (2017)
- [Searching for MobileNetV3](https://mlsanity.com/paper/1905.02244/) (2019)
- [GhostNet: More Features from Cheap Operations](https://mlsanity.com/paper/1911.11907/) (2019)
- [Circle Loss: A Unified Perspective of Pair Similarity Optimization](https://mlsanity.com/paper/2002.10857/) (2020)
- [GCNet: Non-local Networks Meet Squeeze-Excitation Networks and Beyond](https://mlsanity.com/paper/1904.11492/) (2019)
- [SCA-CNN: Spatial and Channel-wise Attention in Convolutional Networks for Image Captioning](https://mlsanity.com/paper/1611.05594/) (2016)
- [Local Relation Networks for Image Recognition](https://mlsanity.com/paper/1904.11491/) (2019)
- [Neural Architecture Search for Lightweight Non-Local Networks](https://mlsanity.com/paper/2004.01961/) (2020)

## Built on by (most cited first, 1 of 1)

- [Semiconductor Wafer Map Defect Classification with Tiny Vision Transformers](https://mlsanity.com/paper/2504.02494/) (2025)

## Abstract (arXiv)

Semiconductor manufacturing is on the cusp of a revolution: the Internet of Things (IoT). With IoT we can connect all the equipment and feed information back to the factory so that quality issues can be detected. In this situation, more and more edge devices are used in wafer inspection equipment. This edge device must have the ability to quickly detect defects. Therefore, how to develop a high-efficiency architecture for automatic defect classification to be suitable for edge devices is the primary task. In this paper, we present a novel architecture that can perform defect classification in a more efficient way. The first function is self-proliferation, using a series of linear transformations to generate more feature maps at a cheaper cost. The second function is self-attention, capturing the long-range dependencies of feature map by the channel-wise and spatial-wise attention mechanism. We named this method as self-proliferation-and-attention neural network. This method has been successfully applied to various defect pattern classification tasks. Compared with other latest methods, SP&A-Net has higher accuracy and lower computation cost in many defect inspection tasks.