# Swept-Angle Synthetic Wavelength Interferometry

arXiv: https://arxiv.org/abs/2205.10655 · HTML: https://mlsanity.com/paper/2205.10655/

## Key facts

- Cited by 2 papers in the map (data through 14 Oct 2026).
- Builds on 6 of its 96 references that are in the map.
- First posted on arXiv 21 May 2022.

## Builds on (most cited first, 6 of 6)

- [Deep Depth From Focus](https://mlsanity.com/paper/1704.01085/) (2017)
- [Asynchronous Single-Photon 3D Imaging](https://mlsanity.com/paper/1908.06372/) (2019)
- [Photon-Flooded Single-Photon 3D Cameras](https://mlsanity.com/paper/1903.08347/) (2019)
- [DeepToF: Off-the-Shelf Real-Time Correction of Multipath Interference in Time-of-Flight Imaging](https://mlsanity.com/paper/1805.09305/) (2018)
- [SRA: Fast Removal of General Multipath for ToF Sensors](https://mlsanity.com/paper/1403.5919/) (2014)
- [Resolving Multi-path Interference in Time-of-Flight Imaging via Modulation Frequency Diversity and Sparse Regularization](https://mlsanity.com/paper/1404.1116/) (2014)

## Built on by (most cited first, 2 of 2)

- [Synthetic Wavelength Imaging -- Utilizing Spectral Correlations for High-Precision Time-of-Flight Sensing](https://mlsanity.com/paper/2209.04941/) (2022)
- [Single-shot ToF sensing with sub-mm precision using conventional CMOS sensors](https://mlsanity.com/paper/2212.00928/) (2022)

## Abstract (arXiv)

We present a new imaging technique, swept-angle synthetic wavelength interferometry, for full-field micron-scale 3D sensing. As in conventional synthetic wavelength interferometry, our technique uses light consisting of two narrowly-separated optical wavelengths, resulting in per-pixel interferometric measurements whose phase encodes scene depth. Our technique additionally uses a new type of light source that, by emulating spatially-incoherent illumination, makes interferometric measurements insensitive to aberrations and (sub)surface scattering, effects that corrupt phase measurements. The resulting technique combines the robustness to such corruptions of scanning interferometric setups, with the speed of full-field interferometric setups. Overall, our technique can recover full-frame depth at a lateral and axial resolution of 5 microns, at frame rates of 5 Hz, even under strong ambient light. We build an experimental prototype, and use it to demonstrate these capabilities by scanning a variety of objects, including objects representative of applications in inspection and fabrication, and objects that contain challenging light scattering effects.