# Exploiting wavelength diversity for high resolution time-of-flight 3D imaging

arXiv: https://arxiv.org/abs/2010.06799 · HTML: https://mlsanity.com/paper/2010.06799/

## Key facts

- Cited by 2 papers in the map (data through 14 Oct 2026).
- First posted on arXiv 14 Oct 2020.

## Built on by (most cited first, 2 of 2)

- [Synthetic Wavelength Imaging -- Utilizing Spectral Correlations for High-Precision Time-of-Flight Sensing](https://mlsanity.com/paper/2209.04941/) (2022)
- [Single-shot ToF sensing with sub-mm precision using conventional CMOS sensors](https://mlsanity.com/paper/2212.00928/) (2022)

## Abstract (arXiv)

State-of-the-art time-of-flight (ToF) based 3D sensors suffer from poor lateral and depth resolutions. In this work, we introduce a novel sensor concept that provides ToF-based 3D measurements of real world objects with depth precisions up to 35 micrometers and point cloud densities at the native sensor-resolutions of state-of-the-art CMOS/CCD cameras (up to several megapixels). Unlike other continuous-wave amplitude-modulated ToF principles, our approach exploits wavelength diversity for an interferometric surface measurement of macroscopic objects with rough or specular surfaces. Based on this principle, we introduce three different embodiments of prototype sensors, exploiting three different sensor architectures.