{"total":21,"rows":[{"id":"2301.11514","title":"Deep Industrial Image Anomaly Detection: A Survey","created":"2023-01-27","cited_by_count":148,"area":null},{"id":"2602.07011","title":"MAU-GPT: Enhancing Multi-type Industrial Anomaly Understanding via Anomaly-aware and Generalist Experts Adaptation","created":"2026-01-31","cited_by_count":6,"area":null},{"id":"2406.07880","title":"A Comprehensive Survey on Machine Learning Driven Material Defect Detection","created":"2024-06-12","cited_by_count":5,"area":null},{"id":"2401.06528","title":"PCB-Vision: A Multiscene RGB-Hyperspectral Benchmark Dataset of Printed Circuit Boards","created":"2024-01-12","cited_by_count":3,"area":null},{"id":"2109.14020","title":"Y-GAN: Learning Dual Data Representations for Efficient Anomaly Detection","created":"2021-09-28","cited_by_count":2,"area":null},{"id":"2202.08414","title":"FPIC: A Novel Semantic Dataset for Optical PCB Assurance","created":"2022-02-17","cited_by_count":2,"area":null},{"id":"2502.14314","title":"ODverse33: Is the New YOLO Version Always Better? A Multi Domain benchmark from YOLO v5 to v11","created":"2025-02-20","cited_by_count":2,"area":null},{"id":"2507.03386","title":"MRC-DETR: An Adaptive Multi-Residual Coupled Transformer for Bare Board PCB Defect Detection","created":"2025-07-04","cited_by_count":2,"area":null},{"id":"2511.20169","title":"ADNet: A Large-Scale and Extensible Multi-Domain Benchmark for Anomaly Detection Across 380 Real-World Categories","created":"2025-11-25","cited_by_count":2,"area":null},{"id":"2409.09555","title":"Enhancing Printed Circuit Board Defect Detection through Ensemble Learning","created":"2024-09-14","cited_by_count":1,"area":null},{"id":"2107.05279","title":"ICDAR 2021 Competition on Integrated Circuit Text Spotting and Aesthetic Assessment","created":"2021-07-12","cited_by_count":0,"area":null},{"id":"2301.05897","title":"Model-based Transfer Learning for Automatic Optical Inspection based on domain discrepancy","created":"2023-01-14","cited_by_count":0,"area":null},{"id":"2407.15427","title":"YOLO-pdd: A Novel Multi-scale PCB Defect Detection Method Using Deep Representations with Sequential Images","created":"2024-07-22","cited_by_count":0,"area":null},{"id":"2506.13476","title":"ESRPCB: an Edge guided Super-Resolution model and Ensemble learning for tiny Printed Circuit Board Defect detection","created":"2025-06-16","cited_by_count":0,"area":null},{"id":"2510.14389","title":"BoardVision: Deployment-ready and Robust Motherboard Defect Detection with YOLO+Faster-RCNN Ensemble","created":"2025-10-16","cited_by_count":0,"area":null},{"id":"2512.17296","title":"Towards Pixel-Wise Anomaly Location for High-Resolution PCBA via Self-Supervised Image Reconstruction","created":"2025-12-19","cited_by_count":0,"area":null},{"id":"2605.04635","title":"UniPCB: A Generation-Assisted Vision-Based Measurement Framework for PCB Defect Inspection","created":"2026-05-06","cited_by_count":0,"area":null},{"id":"2605.24726","title":"From Full Boards to Tiny Defects: Scale-Aware Tile Inference with Topology-Aware Merging for High-Resolution PCB Defect Detection","created":"2026-05-23","cited_by_count":0,"area":null},{"id":"2606.00852","title":"RefDiffNet: Learning to Expose Subtle PCB Defects Before Detection","created":"2026-05-30","cited_by_count":0,"area":null},{"id":"2606.16601","title":"DifferAD-R1: A Difference-Guided IndustrialAnomaly Localization with Multimodal LargeLanguage Models","created":"2026-06-15","cited_by_count":0,"area":null},{"id":"2609.39427","title":"PCB-MC: Missing Component Analysis in Printed Circuit Boards","created":"2026-09-30","cited_by_count":0,"area":null}],"next_cursor":null}